Filmetrics' Products
F20 (General-Purpose Instruments with Full-Analysis Capabilities)
F40 (Microscope-Based Instruments)
F80-c (Automated Mapping of Patterned Semiconductors)
Thickness Measurement (Metrology)
Semiconductor, Optics & Flat Panel Display Applications
Film Thickness, Extinction Coefficients & Refractive Index
Low Cost Bench Top System
Easy to Use Software
Stand Alone or In-Situ
  Manual to Semi-Automatic  
     
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